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Authors: S. Balatti, S. Ambrogio, R. Carboni, V. Milo, Z.-Q. Wang, A. Calderoni, N. Ramaswamy, and D. Ielmini
Journal title: IEEE Trans. Electron Devices
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2016
DOI identifier: 10.1109/TED.2016.2537792
ISSN: 0018-9383