Understanding cycling endurance in perpendicular spin-transfer torque (p-STT) magnetic memory

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Authors: R. Carboni, S. Ambrogio, W. Chen, M. Siddik, J. Harms, A. Lyle, W. Kula, G. Sandhu, D. Ielmini

Journal title: 2016 IEEE International Electron Devices Meeting (IEDM)

Journal publisher: IEEE

Published year: 2016

Published pages: 21.6.1-21.6.4

DOI identifier: 10.1109/IEDM.2016.7838468

ISBN: 978-1-5090-3902-9