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Authors: V. Milo, G. Pedretti, R. Carboni, A. Calderoni, N. Ramaswamy, S. Ambrogio, D. Ielmini
Journal title: 2016 IEEE International Electron Devices Meeting (IEDM)
Journal publisher: IEEE
Published year: 2016
Published pages: 16.8.1-16.8.4
DOI identifier: 10.1109/IEDM.2016.7838435
ISBN: 978-1-5090-3902-9