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Authors: S. Ambrogio, S. Balatti, V. Milo, R. Carboni, Z. Wang, A. Calderoni, N. Ramaswamy, D. Ielmini
Journal title: 2016 IEEE Symposium on VLSI Technology
Journal publisher: IEEE
Published year: 2016
Published pages: 1-2
DOI identifier: 10.1109/VLSIT.2016.7573432
ISBN: 978-1-5090-0638-0