Bipolar-switching operated phase change memory (PCM) for improved high-temperature reliability

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Authors: N. Ciocchini, M. Laudato, A. L. Lacaita, D. Ielmini, M. Boniardi, E. Varesi, P. Fantini

Journal title: 2016 46th European Solid-State Device Research Conference (ESSDERC)

Journal publisher: IEEE

Published year: 2016

Published pages: 377-380

DOI identifier: 10.1109/ESSDERC.2016.7599665

ISBN: 978-1-5090-2969-3