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Authors: I. Muñoz-Martín, S. Bianchi, O. Melnic, A. G. Bonfanti, D. Ielmini
Journal title: IEEE Transactions on Electron Devices
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2021
DOI identifier: 10.1109/ted.2021.3118996
ISSN: 0018-9383