Redundancy and Analog Slicing for Precise In-Memory Machine Learning—Part II: Applications and Benchmark

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Authors: Pedretti, G.; Mannocci, P.; Li, C.; Sun, Z.; Strachan, J. P.; Ielmini, D.

Journal title: Crossref

Journal number: 1

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2021

DOI identifier: 10.1109/ted.2021.3095430

ISSN: 0018-9383