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Authors: Simone Calo; James H. Chandler; Federico Campisano; Keith L. Obstein; Pietro Valdastri
Journal title: IEEE/ASME Transactions on Mechatronics
Journal number: 1
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2020
DOI identifier: 10.1109/tmech.2019.2960308
ISSN: 1083-4435
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