Summary
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Authors: L. Sader, S. Bose, A.K. Kashi, Y. Boussafa, R. Dauliat, P. Roy, M. Fabert, A. Tonello, V. Couderc, M. Kues, B. Wetzel
Journal publisher: IEEE
Published year: 2023
DOI identifier: 10.1109/cleo/europe-eqec57999.2023.10232793