ONIX: An X-ray deep-learning tool for 3D reconstructions from sparse views

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Yuhe Zhang, Zisheng Yao, Tobias Ritschel, Pablo Villanueva-Perez

Journal title: Applied Research

Journal number: 2

Journal publisher: WILEY

Published year: 2023

Published pages: e202300016

DOI identifier: 10.1002/appl.202300016

ISSN: 2702-4288