Prediction error identification with rank-reduced output noise

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Authors: Paul M.J. Van den Hof, Harm H.M. Weerts, Arne G. Dankers

Journal title: 2017 American Control Conference (ACC)

Journal publisher: IEEE

Published year: 2017

Published pages: 382-387

DOI identifier: 10.23919/acc.2017.7962983

ISBN: 978-1-5090-5992-8