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Authors: S. Shikhantsov, A. Thielens, G. Vermeeren, P. Demeester, L. Martens, W. Joseph
Journal title: IEEE Transactions on Electromagnetic compatibility
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2023
DOI identifier: 10.1109/temc.2023.3273475
ISSN: 0018-9375