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Authors: R. Wydaeghe, S. Shikhantsov, E. Tanghe, G. Vermeeren, L. Martnes, P. Demeester, W.Joseph
Journal title: IEEE Access
Journal publisher: Institute of Electrical and Electronics Engineers Inc.
Published year: 2022
DOI identifier: 10.1109/access.2022.3227107
ISSN: 2169-3536