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Authors: Olivier Caytan, Laurens Bogaert, Haolin Li, Joris Van Kerrebrouck, Sam Lemey, Johan Bauwelinck, Piet Demeester, Guy Torfs, Dries Vande Ginste, Hendrik Rogier
Journal title: 2019 IEEE 23rd Workshop on Signal and Power Integrity (SPI)
Journal publisher: IEEE
Published year: 2019
Published pages: 1-4
DOI identifier: 10.1109/sapiw.2019.8781652
ISBN: 978-1-5386-8342-2