Methodology for the investigation of threading dislocations as a source of vertical leakage in AlGaN/GaN-HEMT heterostructures for power devices

Summary

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: S. Besendörfer, E. Meissner, A. Lesnik, J. Friedrich, A. Dadgar, T. Erlbacher

Journal title: Journal of Applied Physics

Journal number: 125/9

Journal publisher: American Institute of Physics

Published year: 2019

Published pages: 095704

DOI identifier: 10.1063/1.5065442

ISSN: 0021-8979