Remarkable Breakdown Voltage on AlN/AlGaN/AlN double heterostructure

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Authors: M. Germain;Farid Medjdoub;H. Miyake;Elke Meissner;J. Derluyn;Riad Kabouche;Idriss Abid;Sven Besendörfer;S. Degroote

Journal title: International Conference on Compound Semiconductor Manufacturing Technology, CS MANTECH 2019, Apr 2019, Minneapolis, United States

Journal publisher: CS MANTECH

Published year: 2019