GaN-on-Silicon buffer decomposition experiment: analysis of the vertical leakage current

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Authors: Borga, M.; MENEGHINI, M.; Benazzi, D; Püsche, R; Derluyn, J; Abid, I; Medjdoub, F.; Meneghesso, G.; Zanoni, E.

Journal title: 43rd Workshop on Compound Semiconductor Devices and Integrated Circuits, WOCSDICE 2019

Journal number: 2

Journal publisher: CNRS - FR

Published year: 2019