Temperature dependent substrate trapping in AlGaN/GaN power devices and the impact on dynamic ron

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Authors: Arno Stockman, Michael Uren, Alaleh Tajalli, Matteo Meneghini, Benoit Bakeroot, Peter Moens

Journal title: 2017 47th European Solid-State Device Research Conference (ESSDERC)

Journal publisher: IEEE

Published year: 2017

Published pages: 130-133

DOI identifier: 10.1109/ESSDERC.2017.8066609

ISBN: 978-1-5090-5978-2