Total suppression of dynamic-ron in AlGaN/GaN-HEMTs through proton irradiation

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Authors: M. Meneghini, A. Tajalli, P. Moens, A. Banerjee, A. Stockman, M. Tack, S. Gerardin, M. Bagatin, A. Paccagnella, E. Zanoni, G. Meneghesso

Journal title: 2017 IEEE International Electron Devices Meeting (IEDM)

Journal publisher: IEEE

Published year: 2017

Published pages: 33.5.1-33.5.4

DOI identifier: 10.1109/IEDM.2017.8268492

ISBN: 978-1-5386-3559-9