Au - Ge Alloys for Wide-Range Low-Temperature On-Chip Thermometry

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Authors: J.R.A. Dann, P.C. Verpoort, J. Ferreira de Oliveira, S.E. Rowley, A. Datta, S. Kar-Narayan, C.J.B. Ford, G.J. Conduit, V. Narayan

Journal title: Physical Review Applied

Journal number: 12/3

Journal publisher: American Physical Society

Published year: 2019

DOI identifier: 10.1103/physrevapplied.12.034024

ISSN: 2331-7019