Time-resolved open-circuit conductive atomic force microscopy for direct electromechanical characterization

Summary

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Authors: Yonatan Calahorra, Wonjong Kim, Jelena Vukajlovic-Plestina, Anna Fontcuberta i Morral, Sohini Kar-Narayan

Journal title: Nanotechnology

Journal publisher: Institute of Physics Publishing

Published year: 2020

DOI identifier: 10.1088/1361-6528/ab9b4b

ISSN: 0957-4484