Extracting Decay-Rate Ratios From Photoluminescence Quantum Efficiency Measurements in Optoelectronic Semiconductors

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Authors: Alan R. Bowman, Stuart Macpherson, Anna Abfalterer, Kyle Frohna, Satyawan Nagane, Samuel D. Stranks

Journal title: Phys. Rev. Applied

Journal number: 17

Journal publisher: American Physical Society

Published year: 2022

Published pages: 044026

DOI identifier: 10.1103/physrevapplied.17.044026

ISSN: 2331-7019