High-resolution transmission electron microscopy investigation of diffusion in metallic glass multilayer films

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Authors: S.V. Ketov, Yu P. Ivanov, D. Şopu, D.V. Louzguine-Luzgin, C. Suryanarayana, A.O. Rodin, T. Schöberl, A.L. Greer, J. Eckert

Journal title: Materials Today Advances

Journal number: 1

Journal publisher: Elsevier

Published year: 2019

Published pages: 100004

DOI identifier: 10.1016/j.mtadv.2019.01.003

ISSN: 2590-0498