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Authors: N. Oliva, E. A. Casu, C. Yan, A. Krammer, A. Magrez, A. Schueler, O. J. F. Martin, A. M. Ionescu
Journal title: 2017 IEEE International Electron Devices Meeting (IEDM)
Journal publisher: IEEE
Published year: 2017
Published pages: 36.1.1-36.1.4
DOI identifier: 10.1109/IEDM.2017.8268503
ISBN: 978-1-5386-3559-9