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Authors: F. Bellando, E. Garcia-Cordero, F. Wildhaber, J. Longo, H. Guerin, A. M. Ionescu
Journal title: 2017 IEEE International Electron Devices Meeting (IEDM)
Journal publisher: IEEE
Published year: 2017
Published pages: 18.1.1-18.1.4
DOI identifier: 10.1109/IEDM.2017.8268413
ISBN: 978-1-5386-3559-9