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Authors: E.A. Casu, W.A. Vitale, N. Oliva, T. Rosca, A. Biswas, C. Alper, A. Krammer, G.V. Luong, Q.T. Zhao, S. Mantl, A. Schuler, A. Seabaugh, A.M. Ionescu
Journal title: 2016 IEEE International Electron Devices Meeting (IEDM)
Journal publisher: IEEE
Published year: 2016
Published pages: 19.3.1-19.3.4
DOI identifier: 10.1109/IEDM.2016.7838452
ISBN: 978-1-5090-3902-9