Negative capacitance field effect transistors; capacitance matching and non-hysteretic operation

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Authors: Ali Saeidi, Farzan Jazaeri, Francesco Bellando, Igor Stolichnov, Christian C. Enz, Adrian M. Ionescu

Journal title: 2017 47th European Solid-State Device Research Conference (ESSDERC)

Journal publisher: IEEE

Published year: 2017

Published pages: 78-81

DOI identifier: 10.1109/ESSDERC.2017.8066596

ISBN: 978-1-5090-5978-2