Design Considerations of Ferroelectric Properties for Negative Capacitance MOSFETs

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Authors: Ali Saeidi, Farzan Jazaeri, Igor Stolichnov, Christian C. Enz, Adrian M. Ionescu

Journal title: 2018 IEEE 2nd Electron Devices Technology and Manufacturing Conference (EDTM)

Journal publisher: IEEE

Published year: 2018

Published pages: 10-12

DOI identifier: 10.1109/edtm.2018.8421443

ISBN: 978-1-5386-3712-8