Fast Segmentation From Blurred Data in 3D Fluorescence Microscopy

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Authors: Martin Storath, Dennis Rickert, Michael Unser, Andreas Weinmann

Journal title: IEEE Transactions on Image Processing

Journal number: 26/10

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2017

Published pages: 4856-4870

DOI identifier: 10.1109/TIP.2017.2716843

ISSN: 1057-7149