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Authors: Eleonora Testa, Odysseas Zografos, Mathias Soeken, Adrien Vaysset, Mauricio Manfrini, Rudy Lauwereins, Giovanni De Micheli
Journal title: 2017 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)
Journal publisher: IEEE
Published year: 2017
Published pages: 164-169
DOI identifier: 10.1109/ISVLSI.2017.37
ISBN: 978-1-5090-6762-6