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Authors: O. Zografos, A. De Meester, E. Testa, M. Soeken, P.-E. Gaillardon, G. De Micheli, L. Amaru, P. Raghavan, F. Catthoor, R. Lauwereins
Journal title: Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017
Journal publisher: IEEE
Published year: 2017
Published pages: 1306-1311
DOI identifier: 10.23919/DATE.2017.7927195
ISBN: 978-3-9815370-8-6
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