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Authors: Peter Haigh, Michael Hayes, Dinesh R. Gawade, Brendan O'Flynn
Journal title: 2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
Journal publisher: IEEE
Published year: 2020
Published pages: 1-6
DOI identifier: 10.1109/i2mtc43012.2020.9128887
ISBN: 978-1-7281-4460-3
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