Running Efficiently CNNs on the Edge Thanks to Hybrid SRAM-RRAM In-Memory Computing

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Authors: Marco Rios, Flavio Ponzina, Giovanni Ansaloni, Alexandre Levisse, David Atienza

Journal title: 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)

Journal publisher: IEEE

Published year: 2021

Published pages: 1881-1886

DOI identifier: 10.23919/date51398.2021.9474233

ISBN: 978-3-9819263-5-4