Impact of Memory Voltage Scaling on Accuracy and Resilience of Deep Learning Based Edge Devices

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Authors: Benoit W. Denkinger, Flavio Ponzina, Soumya S. Basu, Andrea Bonetti, Szabolcs Balasi, Martino Ruggiero, Miguel Peon-Quiros, Davide Rossi, Andreas Burg, David Atienza

Journal title: IEEE Design & Test

Journal number: August 2019

Journal publisher: IEEE Computer Society

Published year: 2019

Published pages: 1-1

DOI identifier: 10.1109/mdat.2019.2947282

ISSN: 2168-2356