Impact of Bi incorporation on the evolution of microstructure during growth of low-temperature GaAs:Bi/Ga(As,Bi) layers

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Authors: E. Luna, M. Wu, T. Aoki, M. R. McCartney, J. Puustinen, J. Hilska, M. Guina, D. J. Smith, A. Trampert

Journal title: Journal of Applied Physics

Journal number: 126/8

Journal publisher: American Institute of Physics

Published year: 2019

Published pages: 085305

DOI identifier: 10.1063/1.5111532

ISSN: 0021-8979