Influence of ex-situ annealing on the properties of MgF2 thin films deposited by electron beam evaporation

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Authors: Jarno Reuna, Ville Polojärvi, Pertti Pääkkönen, Kimmo Lahtonen, Marianna Raappana, Timo Aho, Riku Isoaho, Arto Aho, Mika Valden, Mircea Guina

Journal title: Optical Materials

Journal number: 96

Journal publisher: Elsevier BV

Published year: 2019

Published pages: 109326

DOI identifier: 10.1016/j.optmat.2019.109326

ISSN: 0925-3467