Berry phase engineering at oxide interfaces

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Authors: D. J. Groenendijk, C. Autieri, T. C. van Thiel, W. Brzezicki, J. R. Hortensius, D. Afanasiev, N. Gauquelin, P. Barone, K. H. W. van den Bos, S. van Aert, J. Verbeeck, A. Filippetti, S. Picozzi, M. Cuoco, A. D. Caviglia

Journal title: Physical Review Research

Journal number: Vol. 2, Iss. 2

Journal publisher: American Physical Society

Published year: 2020

Published pages: 023404-1 - 023404-8

DOI identifier: 10.1103/physrevresearch.2.023404

ISSN: 0031-9007