1/f Noise Characterization of Bilayer MoS2 Field-Effect Transistors on Paper with Inkjet-Printed Contacts and hBN Dielectrics

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Authors: Lorenzo Pimpolari; Gabriele Calabrese; Silvia Conti; Robyn Worsley; Subimal Majee; Dmitry K. Polyushkin; Matthias Paur; Cinzia Casiraghi; Thomas Mueller; Giuseppe Iannaccone; Massimo Macucci; Gianluca Fiori

Journal title: Advanced Electronic Materials

Journal number: 2199160X

Journal publisher: Wiley

Published year: 2021

DOI identifier: 10.1002/aelm.202100283

ISSN: 2199-160X