Convergent beam electron diffraction of multilayer Van der Waals structures

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Authors: Tatiana Latychevskaia, Colin Robert Woods, Yi Bo Wang, Matthew Holwill, Eric Prestat, Sarah J. Haigh, Kostya S. Novoselov

Journal title: Ultramicroscopy

Journal number: 212

Journal publisher: Elsevier BV

Published year: 2020

Published pages: 112976

DOI identifier: 10.1016/j.ultramic.2020.112976

ISSN: 0304-3991