Direct measurement of TEM lamella thickness in FIB‐SEM

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Authors: A.P. CONLAN, E. TILLOTSON, A. RAKOWSKI, D. COOPER, S.J. HAIGH

Journal title: Journal of Microscopy

Journal number: 12

Journal publisher: Blackwell Publishing Inc.

Published year: 2020

Published pages: in press

DOI identifier: 10.1111/jmi.12852

ISSN: 0022-2720