In situ through-thickness analysis of crack tip fields with synchrotron X-ray diffraction

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Authors: Pablo Lopez-Crespo; J.V. Peralta; Joe Kelleher; Philip J. Withers

Journal title: Lopez-Crespo , P , Vazquez-Peralta , J , Kelleher , J F & Withers , P 2019 , ' In situ through-thickness analysis of crack tip fields with synchrotron X-ray diffraction ' , International Journal of Fatigue , vol. 127 , pp. 500 . https://doi.org/10.1016/j.ijfatigue.2019.06.029

Journal number: 4

Journal publisher: Elsevier BV

Published year: 2019

Published pages: 500-508

DOI identifier: 10.1016/j.ijfatigue.2019.06.029

ISSN: 0142-1123