Comparing Xe+pFIB and Ga+FIB for TEM sample preparation of Al alloys: Minimising FIB-induced artefacts

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Authors: Xiangli Zhong; C. Austin Wade; Philip J. Withers; Xiaorong Zhou; Changrun Cai; Sarah J. Haigh; M. Grace Burke

Journal title: Journal of Microscopy

Journal number: 282

Journal publisher: Blackwell Publishing Inc.

Published year: 2021

Published pages: 2

DOI identifier: 10.1111/jmi.12983

ISSN: 0022-2720