Coupled Broad Ion Beam-Scanning Electron Microscopy (BIB-SEM) for polishing and three dimensional (3D) serial section tomography (SST)

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Authors: A. Gholinia et al

Journal title: Ultramicroscopy

Journal number: 10.1016/j.ultramic.2020.112989

Journal publisher: Elsevier BV

Published year: 2020

Published pages: vol. 214

DOI identifier: 10.1016/j.ultramic.2020.112989

ISSN: 0264-1275