Microstructural degradation of Electron Beam-Physical Vapour Deposition Thermal Barrier Coating during thermal cycling tracked by X-ray micro-computed tomography

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Authors: Xun Zhang, Yang Zhao, Philip J. Withers, Ping Xiao

Journal title: Scripta Materialia

Journal number: 152

Journal publisher: Pergamon Press Ltd.

Published year: 2018

Published pages: 79-83

DOI identifier: 10.1016/j.scriptamat.2018.04.010

ISSN: 1359-6462