In situ through-thickness analysis of crack tip fields with synchrotron X-ray diffraction

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Authors: P. Lopez-Crespo, J. V. Peralta, J. F. Kelleher, and P. J. Withers

Journal title: International Journal of Fatigue

Journal publisher: Elsevier BV

Published year: 2019

Published pages: vol. 127, pp. 500-508

DOI identifier: 10.1016/j.ijfatigue.2019.06.029

ISSN: 0264-1275