Coupled Broad Ion Beam–Scanning Electron Microscopy (BIB–SEM) for polishing and three dimensional (3D) serial section tomography (SST)

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Authors: Ali Gholinia; Matthew E. Curd; Etienne Bousser; Kevin G. Taylor; Thijs C. Hosman; Steven Thomas Coyle; Michael Hassel Shearer; John Andrew Hunt; Philip J. Withers

Journal title: Ultramicroscopy

Journal number: 1

Journal publisher: Elsevier BV

Published year: 2020

Published pages: 1-13

DOI identifier: 10.1016/j.ultramic.2020.112989

ISSN: 0304-3991