Defect evolution during high temperature tension-tension fatigue of SLM AISi10Mg alloy by synchrotron tomography

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Authors: J. G. Bao et al

Journal title: Materials Science and Engineering a-Structural Materials Properties Microstructure and Processing

Journal publisher: Elsevier BV

Published year: 2020

Published pages: vol. 792

DOI identifier: 10.1016/j.msea.2020.139809

ISSN: 0264-1275