Summary
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Authors: C. Eschenbaum, A. Mertens, C. Füllner, A. Kuzmin, A. Schwarzenberger, A. Kotz, G. Ramann, M. Chen, J. Drisko, B. Johnson, J. Zyskind, J. Marcelli, M. Lebby, W. Freude, S. Randel, and C. Koos
Journal publisher: IEEE
Published year: 2022
ISBN: 978-1-957171-15-9