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Authors: C. Füllner, A. Sherifaj, T. Henauer, D. Fang, D. Drayss, T. Harter, T. Z. Gutema, W. Freude, S. Randel, and C. Koos
Journal publisher: IEEE
Published year: 2022
DOI identifier: 10.1364/cleo_si.2022.sth5m.3
ISBN: 978-1-957171-05-0
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