Nonlinear Loss and Damage Threshold in Silicon Photonic Waveguides: Modelling and Experimental Verification

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Authors: Stefan Singer, Philipp Trocha, Heiner Zwickel, Clemens Kieninger, Juned Kemal, Mathias Kaschel, Christoph Menzel, Sebastian Randel, Wolfgang Freude, and Christian Koos

Journal publisher: IEEE

Published year: 2022

DOI identifier: 10.1364/cleo_si.2022.sf3o.4

ISBN: 978-1-957171-05-0